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Thin Film Materials for Nanometer-Scale Spatial Profiling of Electrified Polymer Interfaces
Monday, March 08, 2021: 8:30 AM - 6:00 PM
Speaker(s)
Description
The interface separating anion-exchange membrane (AEM) and cation-exchange membrane (CEM) phases within bipolar membranes is being investigated. Bilayer thin films composed of adjacent AEM and CEM materials are being developed to support in-situ neutron reflectometry (NR) depth profiling of bipolar membranes under the influence of an applied transmembrane potential key to driving chemistry in practical applications (i.e., separations, synthesis and energy conversion). NR is being adapted for its ability to provide sub-nanometer spatial resolution in depth profiling polymer interfaces. Since NR measurements require a high degree of sample in-plane uniformity (< 2% variation across the film) and are limited in scanning depth to < 500 nm, model bilayer thin films are being prepared using spin-casting techniques and solubilized dispersion forms of the AEM and CEM polymers. The poster will present results that show factors affecting the selection of the AEM and CEM polymers and mobile ions under study and demonstrate the use of voltammetry techniques for characterizing the long-term stability and the selective ion-exchange properties of the bipolar films. The materials will be employed in NR measurements that profile composition through the AEM-CEM interface to elucidate effects of interfacial ion-depletion/water accumulation and electric-field assisted water dissociation on energy efficiency in applications of bipolar membranes.
Additional Info
Keywords: Please select up to 4 keywords ONLY:
Physical Measurements,Renewable Energy,Spectroelectrochemistry,Voltammetry
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