SPECS leads the way in state-of-the-art technology, cutting-edge components, and compact and individually designed systems for surface analysis. The customized systems are highly integrated with facilities for sample and thin film preparation and in-situ analysis from UHV to high pressures. Our newest solution for environmental XPS is the award-winning EnviroESCA, which features quick sample throughput at Near Ambient Pressure. Our innovative product for ARPES research is the KREIOS 150, which combines a hemispherical analyzer with a new PEEM lens approach. This allows it to access the full photo electron emission hemisphere(±90°). We also offer a variety of sources for deposition, excitation, and charge neutralizers as well as analyzers, X-Ray sources, and research microscopes like LEEM and LT-STM.