The J.A. Woollam company has over 30 years experience in spectroscopic ellipsometry. We offer a wide range of spectroscopic ellipsometers for nondestructive materials characterization including thin film thickness (single and multilayer), optical constants, composition, growth/etch rate, and more. We have instruments available for research and manufacturing metrology covering spectral ranges from vacuum ultra-violet to infrared. We pride ourselves in creating the most advanced, high quality and reliable ellipsometers. We are your Ellipsometry experts.