HORIBA Scientific turnkey or custom standard microscope spectroscopy systems for Raman, Photoluminescence, PL Lifetimes, and electroluminescence; InGaAs and CMOS detectors, scientific and deep-cooled cameras, CCD and PDA mini spectrometers, Cathodoluminescence for SEM, and MicOS for photoluminescence and electroluminescence. We also offer Spectroscopic Ellipsometers for non-destructive characterization of multi-layer film thickness, optical constants, and materials analysis. Benchtop, in-situ or in-line configurations cover VUV to NIR. We also provide in-situ End Point Detectors for real time plasma analysis. New Uvisel Plus modular ellipsometer for thin film measurements, with FastAcq acquisition technology designed to measure thin film samples faster, and more accurately.