Toggle navigation
HOME
FLOOR PLAN
EXHIBITOR LIST
Exhibitor Login
BOOTH RESERVATION
EXHIBITOR CONSOLE
Search
Toggle navigation
HOME
FLOOR PLAN
EXHIBITOR LIST
Exhibitor Login
BOOTH RESERVATION
EXHIBITOR CONSOLE
Search
Your search produced the following search result(s) for these filters:
Category: Product Categories (Scanning Transmission Electron Microscopes (STEM))
×
Close
Send Mail
To :
Message :
Please enter message details.
Character Limit: 500 characters.
Loading ...
×
Close
Appointment Date*
Sunday, Jul 31 2022
Monday, Aug 01 2022
Tuesday, Aug 02 2022
Wednesday, Aug 03 2022
Thursday, Aug 04 2022
Start Time*
1
2
3
4
5
6
7
8
9
10
11
12
:
00
15
30
45
AM
PM
End Time*
1
2
3
4
5
6
7
8
9
10
11
12
:
00
15
30
45
AM
PM
Check My Calendar
Location*
Status*
Your Message
*
Please enter the Message.
Message should be equal to or lesser than 1000 chars.
Comments
Notes should be equal to or lesser than 4000 chars.
Please enter notes
All
Sun Jul, 31
Mon Aug, 01
Tue Aug, 02
Wed Aug, 03
Thu Aug, 04
Legend
Available Timeslot
Scheduled Appointment
Personal Appointments
Appointment Request
Blocked Timeslot
Restricted Timeslot
Cancelled
Declined
Loading ...
×
Close
Exhibitor List
Advanced Search
My Exhibitors
Help
Print
Floor Plan
Refine Search
8 Exhibitors
Search
Category
(
)
Product Categories
Accessories (miscellaneous)
AFM / STM Accessories
Anti-Contamination Systems
Atom Probe
Atomic Force Microscopes
Auger Microscopes
Backscatter Detectors
Calibration and Reference Standards / Reference Materials
Camera / Digital Camera Systems - CDC, CMOS, Megapixel
Chemicals
Cold Sputtering Equipment
Confocal Microscopes
Consulting
Courses / Workshops
Critical Point Dryers
Cryoequipment
Crystallographic Mapping
Databases
Detectors
Diamond Knives
Dual Beam FIB/SEM
E Beam Lithography
EDS Detectors & Systems
Electrical Characterization
Electron Backscattered Diffraction (EBSD)
Electron Microprobes / EPMA
Failure Analysis
FIB accessories
Filaments and Filament Rebuilding - Field Emission Sources, Lab6 Sources
Fixatives
Fluorescence Microscopy
Focused Ion Beam Systems / Workstations
FT-IR Microscopy
Glow Discharge Cleaning
Image Analysis and Processing
Immuno-Labeling
Ion Pumps New and Rebuilding
Journals
Knife Resharpening / Resharpening Services
Knives
Light Microscopes
Metallography Equipment
Micro-CT Scanning
Micromanipulators
Microtome and Ultramicrotome Repair
Microtomes and Ultramicrotomes
Microwave Tissue Processing
Nano Indentation
Nanopositioners & Stages
Nanoprobes / Mechanical Microprobes
New and Used Equipment
Other
Phase Identification
Plasma Cleaners
Raman Spectroscopy / Microscopy
Scanning Electron Microscopes (SEM)
Scanning Probe Microscope Accessories
Scanning Transmission Electron Microscopes (STEM)
Scanning Tunneling Microscopes
Secondary Ion Mass Spectrometer (SIMS)
SEM / STEM Digital Imaging Systems
SEM Accessories
SEM Stages, Mounts and Holders
Service & Repair
Service Laboratories
Software
Specimen Preparation & Handling
Specimen Storage
Spectrometers
Stage Automation
Stereoscopic Viewing Systems
Supplies
Surface Analysis
Surface Profiling
Tabletop SEM/TEM
TEM Accessories
TEM Specimen Holders
Testing Equipment
Transmission Electron Microscopes (TEM)
Vacuum Equipment
Vacuum Evaporators
Vibration Isolation Systems
WDS Detectors & Systems
X-ray Analysis Equipment
Country
(
|
)
Canada
Alberta
Quebec
Czech Republic
France
Germany
Ireland
Japan
Korea (South)
Switzerland
United Kingdom
United States
Arizona
California
Florida
Illinois
Indiana
Maryland
Massachusetts
Minnesota
New Jersey
New Mexico
New York
North Carolina
Ohio
Oregon
Pennsylvania
Vermont
Virginia
Washington
Wisconsin
Search
Reset
EXHIBITOR NAME
Booth
DECTRIS Ltd
1636
Hitachi High-Tech America, Inc.
1878
Hummingbird Scientific
1243
JEOL USA, Inc.
1758, MR 1
Nion Company
1848
Point Electronic GmbH
1680
Quantum Detectors
1765
Thermo Fisher Scientific
1236, MR 2, MR 3, MR 6
For Technical Support with this webpage, please contact
support
.