Angstrom Scientific Inc. represents a number of leading manufacturers supporting materials imaging and analysis. These include Hitachi: tabletop SEMs, Imina: nano-probe system and Point: EBIC/EBAC, Leica: Sample prep., Deben: Tensile Stages, NenoVision: in-Situ SEM AFM & Alemnis: in-Situ Nano-Indenter. Please visit our booth 1779 and/or www.angstrom.us.