zeroK NanoTech Corporation

Gaithersburg,  MD 
United States

zeroK NanoTech produces focused ion beam (FIB-SEM) and SIMS instruments with unmatched performance and new capabilities. With our FIB platform you can mill smaller structures than is possible with gallium-based systems. Our Cs+ SIMS system enables elemental analysis at sub 10-nm resolutions, and can perform in domains traditionally served by other techniques like EDX.

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