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Category: Product Categories (Scanning Electron Microscopes (SEM))
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Appointment Date*
Monday, Jul 29 2024
Tuesday, Jul 30 2024
Wednesday, Jul 31 2024
Thursday, Aug 01 2024
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Mon Jul, 29
Tue Jul, 30
Wed Jul, 31
Thu Aug, 01
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Accessories (miscellaneous)
AFM / STM Accessories
Anti-Contamination Systems
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FIB accessories
Filaments and Filament Rebuilding - Field Emission Sources, Lab6 Sources
Fixatives
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Glow Discharge Cleaning
Image Analysis and Processing
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Ion Pumps New and Rebuilding
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New and Used Equipment
Optical Filters, Fluorescence Filters
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Phase Identification
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Publishers
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Scanning Probe Microscope Accessories
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EXHIBITOR NAME
Booth
Carl Zeiss Microscopy, LLC
1310
COXEM
223
Euclid TechLabs, LLC
1622
Hitachi High-Tech America, Inc.
214
Integrated Dynamics Engineering
1029
JEOL USA, Inc.
710
Nanoscience Instruments
527
Norcada, Inc.
1031
Point Electronic GmbH
429
Raith America, Inc.
629
Scientific Bridge
227
SiriusXT Ltd
319
TESCAN
521
Thermo Fisher Scientific
1120
Voxa
435