New models of EM-30 NEXT Tabletop SEM and CX-200plus Full-Size SEM utilizing the newest innovation in image scanning with near real-time auto-focus. Both SEM systems will be showing EDS with automated feature analysis - the new Oxford Xplore on the CX-200plus and the Bruker XFlash on the EM-30N. New CP-8000 Ion Mill Cross Section Polisher and SP-20 entry level Sputter Coater for sample preparation.