Angstrom Scientific Inc.

Ramsey,  NJ 
United States
http://www.angstrom.us

Angstrom Scientific Inc. represents a number of leading manufacturers supporting materials imaging and analysis. These include Hitachi Tabletop SEMs, Imina Nanoprobing systems, Point EBIC/EBAC, Leica Sample Prep tools, Deben Stages and Accessories, NenoVision In-Situ AFM, Alemnis In-Situ Nano-Indenters, EMSIS TEM Cameras, and Attolight Quantitative CL systems.

Categories

Product Categories
  • AFM / STM Accessories
  • Atomic Force Microscopes
  • Backscatter Detectors
  • Camera / Digital Camera Systems - CDC, CMOS, Megapixel
  • Critical Point Dryers
  • CryoEM Sample Handling
  • CryoEM Sample Preparations
  • Cryoequipment
  • Detectors
  • EDS Detectors & Systems
  • Electrical Characterization
  • Failure Analysis
  • FIB accessories
  • Micro-CT Scanning
  • Micromanipulators
  • Microprobes
  • Microtomes and Ultramicrotomes
  • Nano Indentation
  • Nanopositioners & Stages
  • Nanoprobes / Mechanical Microprobes
  • New and Used Equipment
  • Scanning Electron Microscopes (SEM)
  • SEM Accessories
  • SEM Stages, Mounts and Holders
  • Specimen Preparation & Handling
  • Surface Analysis
  • Surface Profiling
  • Tabletop SEM/TEM
  • TEM Accessories
  • TEM Specimen Holders
  • Vacuum Equipment
  • X-ray Analysis Equipment
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