World’s only high-resolution, self-aligning inspection.
Dark Field’s patent-pending high-resolution laser systems deliver unparalleled defect detection and metrology. On-line, 100% RTR, sheet or custom turnkey systems for flexible electronics, glass and glass wafers, silicon wafers, film, displays, curved glass and VR/AR/MR headsets. Solid State Laser Reflection (SSLR) technology detects defects to 1μm in transmission or first surface reflection for detection of particles and residue (unclean areas which would result in coating defects). System produces a Clean Number for Glass and Wafers which can be used to monitor and control the upstream Cleaner. Unique self-aligning SSLR means no maintenance. Systems deliver G/NG decisions within one second; used for IQC, in-process and final QC. Systems are designed and built in our Engineering Center in New Haven CT. Production scale glass conveyors and film rewinders are utilized to simulate true production conditions. Benefits include increased throughput, yield and quality while reducing scrap and operating costs. Contact us today for a free evaluation.