J.A. Woollam offers a wide range of spectroscopic ellipsometers for non-destructive materials characterization,including thin film thickness of single and multilayer films,refractive index, optical constants n&k, alloy composition, in-situ growth/etch rates, and more. We have instrumetns available for research and manufacturing metrology. J.A. Woollam instruments include table-top, in-line and in-situ models covering spectral ranges from the vacuum ultraviolet to far infrared. We pride ourselves in offering the most advanced, highest quality and reliable ellipsometeres. Visit us at www.jawoollam.com.
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