Primer on XRF Spectrometry: Instrumentation
- Room: Short Course Office S100C
- Session Number: SC1246
Monday, March 02, 2020: 1:00 PM - 5:00 PM
Duration:1/2 Day Course
Due to its wide dynamic concentration range, simple sample preparations and least-cost-per-unit analysis, X-ray Fluorescence Spectrometry (XRFS) has been widely used by many industry sectors, such as cement, steel, glass, chemical, petrochemical, pharmaceutical, solar and mineral processing as a primary tool for QA/QC of their products. Based on its instrument configurations, the XRF spectrometers are generally divided into Wavelength Dispersive (sequential) and Energy Dispersive (simultaneous) XRF systems. Depending on the application, each of the systems holds its own analytical advantages and merits. Understanding of their basic instrumentation is the first step to become a successful XRF analyst.
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1. What are the X-rays, X-ray Fluorescence and the Foundation of X-ray Fluorescence Spectrometry?
2. Excitation of X-rays inside an X-ray tube and within the sample matrix.
3. Analyzing Crystals and Dispersion of X-rays in WDXRF and Multi-channel Analyzer in EDXRF.
4. Detection of X-rays - Flow Proportional Counter, Scintillation Counter and Silicon Drift Detectors.
5. Advantages and Disadvantages of XRFS.
It is open to all who are working or intend to work in X-ray spectrometric analysis and who are using the XRF data, such as the geologists, metallurgists, material engineers, plant manager, QC/QA personnel, etc. No previous knowledge in X-ray spectrometry is required