McCormick Place | Chicago, Illinois, USA
March 1 - 5, 2020

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Pittcon Party: Chicago

The biggest party, the biggest night of the week, and the biggest opportunity to brand your company. The Pittcon Party will take place Wednesday evening at the Museum of Science and Industry. It will be a night to remember – and a night for attendees to remember you!

Please contact Maranda Flamm at flamm@pittcon.org to discuss sponsorship opportunities for the Pittcon Party.

Sampling for Particle Size Analysis

  • Room: Short Course Office S100C
  • Session Number: SC1251
Tuesday, March 03, 2020: 8:30 AM - 12:30 PM
Duration:1/2 Day Course

Speaker(s)

Instructor
Alan Rawle
Malvern Panalytical Inc.

Description

A ½-day course that will bring personnel in the particle sizing field up to speed on the importance of sampling for particle size analysis. The course will deal with 2 main objectives – determination of the minimum mass required for any required precision and the calculation of the best fundamental sampling error (FSE) based on the mass used in any particle size determination. We will point out the major issues with sampling including delimitation errors and provide limited advice as to the recommended routes to take a reasonable sample and the dangers of taking limited or unrepresentative samples. The course is suited to users of all particle size analysis techniques from sieves to light scattering.

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Learning Objectives

Session 1 – 45 minutes - Introduction & Course Objectives; garbage in = garbage out
Session 2 - 30 minutes - Minimum mass and precision (standard error/fundamental sampling error, FSE)
Session 3 – 30 minutes - Calculation of the FSE
Session 4 – 15 minutes -Class exercise/practical example
Session 5 – 30 minutes -Sampling devices and delimitation errors
Session 6 – 30 minutes -Break
Session 7 – 1 hour -Sampling from dry powders and slurries – pitfalls to avoid
Session 8 – 30 minutes - Question and answer session/answers to the class exercise
Minimum contact time 4.5 hours

Additional Info

Target Audience:
Those with some practical experience of particle sizing techniques who want to isolate the issues associated with representative and non-representative sampling.



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