Applied Rigaku Technologies, Inc.  

As a multi-purpose, high-performance EDXRF spectrometer, the Rigaku NEX CG delivers routine elemental measurements in a wide variety of sample types — from homogeneous, low viscosity liquids to solids, metals, slurries, powders, and pastes. Unlike conventional EDXRF analyzers, the NEX CG uses a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. Monochromatic or polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. The dramatic reduction in background noise and a simultaneous increase in element peaks result in a spectrometer capable of trace element analysis even in the most challenging sample types. Especially well-suited to the semi-quantitative determination of elemental content in complete unknowns, the superior analytical power, flexibility, and ease-of-use of the NEX CG adds to its broad appeal for applications ranging from research & development to industrial and in-plant quality assurance.

The Rigaku NEX DE Series high-performance EDXRF spectrometers deliver routine elemental measurements across a diverse range of matrices — from homogeneous liquids of any viscosity to solids, thin films, alloys, slurries, powders, and pastes. NEX DE Series analyzers are versatile and equipped with a 60 kV, 12 W X-ray tube, and a high-throughput silicon drift detector (SDD). The SDD detector supports count rates over 500K cps, resulting in low limits of detection. For your small spot analysis needs, the NEX DE VS model additionally offers a high-resolution camera and automated collimators to allow for precise positioning of your sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes. These features, combined with the advanced QuantEZ software, provide unparalleled performance for both bulk (NEX DE) and bulk and small spot (NEX DE VS) analysis. Whether the need is basic quality control (QC) or its more sophisticated variants such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma — NEX DE Series analyzers are the reliable choice for rapid non-destructive elemental analysis of sodium through uranium.

Among Rigaku's line of high-value benchtop EDXRF systems, the NEX QC Series analyzers combine superior performance capabilities with affordability. Designed for rapid qualitative and quantitative elemental analysis, non-destructively analyze elements sodium through uranium in a broad range of applications. From homogenous liquids of any viscosity to solids, thin films, alloys, slurries, powders, and pastes — NEX QC Series analyzers are ideal for routine quality control. The 50 kV X-ray tube and solid state detectors offer exceptional spectral resolution and throughput. The high voltage capability, along with multiple automated tube filters, provides enhanced sensitivity and low limits of detection. Additionally, the intuitive touchscreen interface and built-in printer make these instruments easy to use and convenient. They are available in either a NEX QC or NEX QC+ model for more demanding applications, or for situations where analysis time is critical. The NEX QC+ gives significant improvements in elemental peak resolution and counting statistics, resulting in superior calibrations and precision for the most challenging measurements.

The Rigaku NEX OL process analyzer is an advanced EDXRF instrument for on-line, multi-element analysis of aluminum to uranium for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas. For superior analytical performance and reliability, the EDXRF measuring head assembly comes from the well-established NEX QC+ high-resolution benchtop instrument. This proven technology combined with a 50 kV X-ray tube, a silicon drift detector (SDD), and a standardized, optimized suite of tube filters — the NEX OL serves a broad range of process control applications. In addition to analyzing liquid streams, the NEX OL serves web applications, with the ability to perform multi-element composition analysis for the determination of coating thickness. Typically the head is mounted in a fixed position over a roller so that the head-to-surface distance is constant. Some of the most common applications include papers and plastics, woven and nonwoven fabrics, conversion coatings, and other surface coatings.

Designed explicitly to meet the needs of challenging conditions found in coating processes, the Rigaku NEX LS helps maintain routine quality control. Featuring third-generation EDXRF technology, the NEX LS represents the next evolution of scanning process coatings analyzers for web and coil applications. This instrument’s measuring head assembly comes from the well-established NEX Series high-resolution benchtop instrument. This proven technology ensures superior analytical performance and reliability for the non-destructive elemental analysis of aluminum through uranium. The NEX LS consists of a measurement head mounted to a motorized frame, which carries the head back and forth across a moving web (or coil). Real-time data display as a graphical cross direction and machine direction profile. The NEX LS serves many process control coating applications; however, the most common include release coatings, converters, vacuum-formed plastics, and other industries using silicone oils as barrier layers, release coatings, or denesting agents. Realtime scanning, for tighter process control tolerances, takes EDXRF technology for silicone coatings analysis to the next level.